Localization-driven metal-insulator transition in epitaxial hole-doped Nd 1−x Sr x NiO 3 ultrathin films
Advances in thin film growth technologies make it possible to obtain ultra-thin perovskite oxide films and open the window for controlling novel electronic phases for use in functional nanoscale electronics, such as switches and sensors. Here, we study the thickness-dependent transport characteristi...
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Main Authors: | Wang, Le, Chang, Lei, Yin, Xinmao, Rusydi, Andrivo, You, Lu, Zhou, Yang, Fang, Liang, Wang, Junling |
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其他作者: | School of Materials Science & Engineering |
格式: | Article |
語言: | English |
出版: |
2016
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主題: | |
在線閱讀: | https://hdl.handle.net/10356/84695 http://hdl.handle.net/10220/41950 |
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