All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits

• المؤلفون الرئيسيون: Park, Gyusung, Kim, Minsu, Kim, Chris H., Kim, Bongjin, Reddy, Vijay
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: Conference or Workshop Item
• اللغة: English
• منشور في: 2019
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering; Bias Temperature Instability; Hot Carrier Injection
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/90235; http://hdl.handle.net/10220/48505

Using simple on-chip monitoring circuits, we precisely characterized the impact of hot carrier injection and bias temperature instability on frequency and phase noise degradation of a 65nm all-digital PLL circuit. Experimental data shows that PLL phase noise degrades with aging even though the outpu...