Failure mechanisms of aluminum bondpad peeling during thermosonic bonding
Aluminum bondpad peeling was observed in a newly developed thermosonic wirebonding process for chip-on-board assembly. Through detailed failure analysis and with the help of finite element analysis on stress simulation, the true root cause of the peeling is identified. It is found that the true root...
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Main Authors: | , |
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Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2009
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/91130 http://hdl.handle.net/10220/5337 |
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Institution: | Nanyang Technological University |
Language: | English |