A fast non-Monte-Carlo yield analysis and optimization by stochastic orthogonal polynomials

Performance failure has become a significant threat to the reliability and robustness of analog circuits. In this article, we first develop an efficient non-Monte-Carlo (NMC) transient mismatch analysis, where transient response is represented by stochastic orthogonal polynomial (SOP) expansion unde...

全面介紹

Saved in:
書目詳細資料
Main Authors: Tan, Sheldon X. D., Ren, Junyan, He, Lei, Gong, Fang, Liu, Xuexin, Yu, Hao
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2012
主題:
在線閱讀:https://hdl.handle.net/10356/95526
http://hdl.handle.net/10220/8763
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!

相似書籍