Thermal-reliable 3D clock-tree synthesis considering nonlinear electrical-thermal-coupled TSV model

• Main Authors: Shang, Yang, Zhang, Chun, Yu, Hao, Tan, Chuan Seng, Zhao, Xin, Lim, Sung Kyu
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/96541; http://hdl.handle.net/10220/17271
• Institution: Nanyang Technological University

3D physical design needs accurate device model of through-silicon vias (TSVs). In this paper, physics-based electrical-thermal model is introduced for both signal and dummy thermal TSVs with the consideration of nonlinear electrical-thermal dependence. Taking thermal-reliable 3D clock-tree synthesis as a case-study to verify the effectiveness of the proposed TSV model, one nonlinear programming-based clock-skew reduction problem is formulated to allocate thermal TSVs for clock-skew reduction under non-uniform temperature distribution. With a number of 3D clock-tree benchmarks, experiments show that under the nonlinear electrical-thermal TSV model, insertion of thermal TSVs can effectively reduce temperature-gradient introduced clock-skew by 58.4% on average, and has 11.6% higher clock-skew reduction than the result under linear electrical-thermal model.