Circuits design for contactless testing of nano-scale CMOS devices and circuits

In this letter, a contactless testing system for nano-scale CMOS devices is presented. It includes parameter-specific ring oscillators, modulator and demodulator with capacitive coupling, which can be fully integrated in a standard CMOS technology. These ring oscillators are used to monitor process...

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Bibliographic Details
Main Authors: Yu, Xiao Peng, Lu, Zhenghao, Lim, Wei Meng, Liu, Yang, Hu, Chang Hui
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2013
Subjects:
Online Access:https://hdl.handle.net/10356/99587
http://hdl.handle.net/10220/13663
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Institution: Nanyang Technological University
Language: English

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