Detecting underfill delamination and cracks in flip chip on board assemblies using infrared microscope
International Journal of Microcircuits and Electronic Packaging
Saved in:
Main Authors: | , , , |
---|---|
Other Authors: | |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/112963 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Be the first to leave a comment!