Thermal stability of 2.4 nm period Ni-Nb/C multilayer x-ray mirror
Applied Physics Letters
Saved in:
Main Authors: | Vitta, S., Yang, P. |
---|---|
Other Authors: | SINGAPORE SYNCHROTRON LIGHT SOURCE |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/113043 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Thermal stability of exchange-biased NiFe/FeMn multilayered thin films
by: Chen, H.Y., et al.
Published: (2014) -
Effect of antiferromagnetic thickness on thermal stability of static and dynamic magnetization of NiFe/FeMn multilayers
by: Phuoc, N.N., et al.
Published: (2014) -
An X-Ray crystallographic study of triniobium arsenide (Nb3As)
by: Gannaga Satittada
Published: (2014) -
X-ray analysis and microhardness characterization of TiN/Ti multilayers
by: Li, W., et al.
Published: (2014) -
Demagnification in proximity X-ray lithography and extensibility to 25 nm by optimizing Fresnel diffraction
by: Vladimirsky, Y., et al.
Published: (2014)