Roughening behavior in Si/SiGe heterostructures under O2 + bombardment

10.1016/S0168-583X(03)01711-7

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Main Authors: Lau, G.S., Tok, E.S., Liu, R., Wee, A.T.S., Zhang, J.
Other Authors: INSTITUTE OF ENGINEERING SCIENCE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/113101
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1131012024-11-15T07:05:23Z Roughening behavior in Si/SiGe heterostructures under O2 + bombardment Lau, G.S. Tok, E.S. Liu, R. Wee, A.T.S. Zhang, J. INSTITUTE OF ENGINEERING SCIENCE PHYSICS MATERIALS SCIENCE 10.1016/S0168-583X(03)01711-7 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 215 1-2 76-82 NIMBE 2014-11-28T09:12:01Z 2014-11-28T09:12:01Z 2004-01 Article Lau, G.S., Tok, E.S., Liu, R., Wee, A.T.S., Zhang, J. (2004-01). Roughening behavior in Si/SiGe heterostructures under O2 + bombardment. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 215 (1-2) : 76-82. ScholarBank@NUS Repository. https://doi.org/10.1016/S0168-583X(03)01711-7 0168583X http://scholarbank.nus.edu.sg/handle/10635/113101 000188400400010 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1016/S0168-583X(03)01711-7
author2 INSTITUTE OF ENGINEERING SCIENCE
author_facet INSTITUTE OF ENGINEERING SCIENCE
Lau, G.S.
Tok, E.S.
Liu, R.
Wee, A.T.S.
Zhang, J.
format Article
author Lau, G.S.
Tok, E.S.
Liu, R.
Wee, A.T.S.
Zhang, J.
spellingShingle Lau, G.S.
Tok, E.S.
Liu, R.
Wee, A.T.S.
Zhang, J.
Roughening behavior in Si/SiGe heterostructures under O2 + bombardment
author_sort Lau, G.S.
title Roughening behavior in Si/SiGe heterostructures under O2 + bombardment
title_short Roughening behavior in Si/SiGe heterostructures under O2 + bombardment
title_full Roughening behavior in Si/SiGe heterostructures under O2 + bombardment
title_fullStr Roughening behavior in Si/SiGe heterostructures under O2 + bombardment
title_full_unstemmed Roughening behavior in Si/SiGe heterostructures under O2 + bombardment
title_sort roughening behavior in si/sige heterostructures under o2 + bombardment
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/113101
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