Roughening behavior in Si/SiGe heterostructures under O2 + bombardment
10.1016/S0168-583X(03)01711-7
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Main Authors: | Lau, G.S., Tok, E.S., Liu, R., Wee, A.T.S., Zhang, J. |
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Other Authors: | INSTITUTE OF ENGINEERING SCIENCE |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/113101 |
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Institution: | National University of Singapore |
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