Suppressed leakage in low temperature RTA (700°C 30S) junctions with buried epitaxial Si 1-yC y
Proceedings - Electrochemical Society
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Main Authors: | Tan, C.F., Lee, H., Liu, J.P., Quek, E., Chan, L., Chor, E.F. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/115501 |
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Institution: | National University of Singapore |
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