Device reliability and failure mechanisms related to gate dielectrics and interconnects
Proceedings of the IEEE International Conference on VLSI Design
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| Format: | Conference or Workshop Item |
| Published: |
2014
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| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/116064 |
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| Institution: | National University of Singapore |
| Summary: | Proceedings of the IEEE International Conference on VLSI Design |
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