Device reliability and failure mechanisms related to gate dielectrics and interconnects
Proceedings of the IEEE International Conference on VLSI Design
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sg-nus-scholar.10635-1160642015-01-20T19:22:56Z Device reliability and failure mechanisms related to gate dielectrics and interconnects Radhakrishnan, M.K. INSTITUTE OF MICROELECTRONICS Proceedings of the IEEE International Conference on VLSI Design 17 805-808 PIVDE 2014-12-12T07:35:56Z 2014-12-12T07:35:56Z 2004 Conference Paper Radhakrishnan, M.K. (2004). Device reliability and failure mechanisms related to gate dielectrics and interconnects. Proceedings of the IEEE International Conference on VLSI Design 17 : 805-808. ScholarBank@NUS Repository. 10639667 http://scholarbank.nus.edu.sg/handle/10635/116064 NOT_IN_WOS Scopus |
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Proceedings of the IEEE International Conference on VLSI Design |
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INSTITUTE OF MICROELECTRONICS |
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INSTITUTE OF MICROELECTRONICS Radhakrishnan, M.K. |
| format |
Conference or Workshop Item |
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Radhakrishnan, M.K. |
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Radhakrishnan, M.K. Device reliability and failure mechanisms related to gate dielectrics and interconnects |
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Radhakrishnan, M.K. |
| title |
Device reliability and failure mechanisms related to gate dielectrics and interconnects |
| title_short |
Device reliability and failure mechanisms related to gate dielectrics and interconnects |
| title_full |
Device reliability and failure mechanisms related to gate dielectrics and interconnects |
| title_fullStr |
Device reliability and failure mechanisms related to gate dielectrics and interconnects |
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Device reliability and failure mechanisms related to gate dielectrics and interconnects |
| title_sort |
device reliability and failure mechanisms related to gate dielectrics and interconnects |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/116064 |
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