STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY

STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY

Ph.D

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Bibliographic Details
Main Author: WONG PEI YU CALVIN
Other Authors: DEAN'S OFFICE (NGS FOR INTGR SCI & ENGG)
Format: Theses and Dissertations
Language:English
Published: 2018
Subjects:
BEEM, I-V-T, TMDC, MoS2, WS2, Schottky barrier
Online Access:http://scholarbank.nus.edu.sg/handle/10635/142817
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-1428172020-06-02T13:13:07Z STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY WONG PEI YU CALVIN DEAN'S OFFICE (NGS FOR INTGR SCI & ENGG) Wee Thye Shen, Andrew CEDRIC TROADEC Goh Kuan Eng, Johnson BEEM, I-V-T, TMDC, MoS2, WS2, Schottky barrier Ph.D DOCTOR OF PHILOSOPHY (NGS) 2018-06-04T18:00:29Z 2018-06-04T18:00:29Z 2018-01-26 Thesis WONG PEI YU CALVIN (2018-01-26). STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/142817 0000-0002-3135-7534 en
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
language English
topic BEEM, I-V-T, TMDC, MoS2, WS2, Schottky barrier
spellingShingle BEEM, I-V-T, TMDC, MoS2, WS2, Schottky barrier
WONG PEI YU CALVIN
STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY
description Ph.D
author2 DEAN'S OFFICE (NGS FOR INTGR SCI & ENGG)
author_facet DEAN'S OFFICE (NGS FOR INTGR SCI & ENGG)
WONG PEI YU CALVIN
format Theses and Dissertations
author WONG PEI YU CALVIN
author_sort WONG PEI YU CALVIN
title STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY
title_short STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY
title_full STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY
title_fullStr STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY
title_full_unstemmed STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY
title_sort studying the metal/layered semiconductor schottky interface using temperature dependent current-voltage measurements and ballistic electron emission microscopy
publishDate 2018
url http://scholarbank.nus.edu.sg/handle/10635/142817
_version_ 1681098238648647680

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