A General Dimension Reduction Method for the Dispersion Modeling of Semiconductor Devices

10.1109/ACCESS.2018.2855044

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Bibliographic Details
Main Authors:	Huang, A.-D., Zhong, Z., Guo, Y.-X., Wu, W.
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Article
Published:	Institute of Electrical and Electronics Engineers Inc. 2021
Subjects:	AlGaN/GaN HEMT charge trapping Dimension reduction dispersion empirical model large signal model LDMOS self-heating semiconductor devices Taylor expansion thermal
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/206440
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Institution:	National University of Singapore

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