A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell

10.1109/EDTM53872.2022.9798365

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Bibliographic Details
Main Authors:	Joydeep Ghosh, Shang Yi Lim, Ferdaus Md. Meftahul, Senthilnath Jayavelu, Aaron Voon-Yew Thean
Other Authors:	DEAN'S OFFICE (ENGINEERING)
Format:	Conference or Workshop Item
Language:	English
Published:	IEEE 2023
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/238264
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Institution:	National University of Singapore
Language:	English

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spelling	sg-nus-scholar.10635-2382642024-04-16T10:49:06Z A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell Joydeep Ghosh Shang Yi Lim Ferdaus Md. Meftahul Senthilnath Jayavelu Aaron Voon-Yew Thean DEAN'S OFFICE (ENGINEERING) ELECTRICAL AND COMPUTER ENGINEERING 10.1109/EDTM53872.2022.9798365 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) 2023-03-20T07:35:46Z 2023-03-20T07:35:46Z 2022-06-21 Conference Paper Joydeep Ghosh, Shang Yi Lim, Ferdaus Md. Meftahul, Senthilnath Jayavelu, Aaron Voon-Yew Thean (2022-06-21). A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell. 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). ScholarBank@NUS Repository. https://doi.org/10.1109/EDTM53872.2022.9798365 https://scholarbank.nus.edu.sg/handle/10635/238264 en IEEE
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
description	10.1109/EDTM53872.2022.9798365
author2	DEAN'S OFFICE (ENGINEERING)
author_facet	DEAN'S OFFICE (ENGINEERING) Joydeep Ghosh Shang Yi Lim Ferdaus Md. Meftahul Senthilnath Jayavelu Aaron Voon-Yew Thean
format	Conference or Workshop Item
author	Joydeep Ghosh Shang Yi Lim Ferdaus Md. Meftahul Senthilnath Jayavelu Aaron Voon-Yew Thean
spellingShingle	Joydeep Ghosh Shang Yi Lim Ferdaus Md. Meftahul Senthilnath Jayavelu Aaron Voon-Yew Thean A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell
author_sort	Joydeep Ghosh
title	A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell
title_short	A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell
title_full	A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell
title_fullStr	A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell
title_full_unstemmed	A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell
title_sort	simulation approach to analyze bridge-defects in a 6t-sram bit cell
publisher	IEEE
publishDate	2023
url	https://scholarbank.nus.edu.sg/handle/10635/238264
_version_	1800915799444029440

A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell

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