A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell

A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell

10.1109/EDTM53872.2022.9798365

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Bibliographic Details
Main Authors: Joydeep Ghosh, Shang Yi Lim, Ferdaus Md. Meftahul, Senthilnath Jayavelu, Aaron Voon-Yew Thean
Other Authors: DEAN'S OFFICE (ENGINEERING)
Format: Conference or Workshop Item
Language:English
Published: IEEE 2023
Online Access:https://scholarbank.nus.edu.sg/handle/10635/238264
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Institution: National University of Singapore
Language: English

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https://scholarbank.nus.edu.sg/handle/10635/238264

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