A Simulation Approach to Analyze Bridge-Defects in a 6T-SRAM Bit Cell
10.1109/EDTM53872.2022.9798365
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| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
IEEE
2023
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| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/238264 |
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| Institution: | National University of Singapore |
| Language: | English |