RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES

Master's

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Bibliographic Details
Main Author: CAI MIAO
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2023
Subjects:
Online Access:https://scholarbank.nus.edu.sg/handle/10635/239053
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-2390532023-04-30T18:00:38Z RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES CAI MIAO ELECTRICAL & COMPUTER ENGINEERING Yongxin Guo LEANG SERN EE Chunxiang Zhu Reliability; HV LDMOS; HCI; BTI; Degradation; SOA Master's MASTER OF ENGINEERING (CDE) 2023-04-30T18:00:38Z 2023-04-30T18:00:38Z 2023-01-09 Thesis CAI MIAO (2023-01-09). RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/239053 0009-0008-9688-3368 en
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
language English
topic Reliability; HV LDMOS; HCI; BTI; Degradation; SOA
spellingShingle Reliability; HV LDMOS; HCI; BTI; Degradation; SOA
CAI MIAO
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES
description Master's
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
CAI MIAO
format Theses and Dissertations
author CAI MIAO
author_sort CAI MIAO
title RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES
title_short RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES
title_full RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES
title_fullStr RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES
title_full_unstemmed RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES
title_sort reliability characterization and modeling for high voltage ldmos devices
publishDate 2023
url https://scholarbank.nus.edu.sg/handle/10635/239053
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