RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES
Master's
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Language: | English |
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2023
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/239053 |
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sg-nus-scholar.10635-2390532023-04-30T18:00:38Z RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES CAI MIAO ELECTRICAL & COMPUTER ENGINEERING Yongxin Guo LEANG SERN EE Chunxiang Zhu Reliability; HV LDMOS; HCI; BTI; Degradation; SOA Master's MASTER OF ENGINEERING (CDE) 2023-04-30T18:00:38Z 2023-04-30T18:00:38Z 2023-01-09 Thesis CAI MIAO (2023-01-09). RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/239053 0009-0008-9688-3368 en |
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National University of Singapore |
building |
NUS Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NUS Library |
collection |
ScholarBank@NUS |
language |
English |
topic |
Reliability; HV LDMOS; HCI; BTI; Degradation; SOA |
spellingShingle |
Reliability; HV LDMOS; HCI; BTI; Degradation; SOA CAI MIAO RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
description |
Master's |
author2 |
ELECTRICAL & COMPUTER ENGINEERING |
author_facet |
ELECTRICAL & COMPUTER ENGINEERING CAI MIAO |
format |
Theses and Dissertations |
author |
CAI MIAO |
author_sort |
CAI MIAO |
title |
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
title_short |
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
title_full |
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
title_fullStr |
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
title_full_unstemmed |
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
title_sort |
reliability characterization and modeling for high voltage ldmos devices |
publishDate |
2023 |
url |
https://scholarbank.nus.edu.sg/handle/10635/239053 |
_version_ |
1765213775026192384 |