RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES
Master's
محفوظ في:
| المؤلف الرئيسي: | |
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| مؤلفون آخرون: | |
| التنسيق: | Theses and Dissertations |
| اللغة: | English |
| منشور في: |
2023
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| الموضوعات: | |
| الوصول للمادة أونلاين: | https://scholarbank.nus.edu.sg/handle/10635/239053 |
| الوسوم: |
إضافة وسم
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| المؤسسة: | National University of Singapore |
| اللغة: | English |
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sg-nus-scholar.10635-239053 |
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| spelling |
sg-nus-scholar.10635-2390532024-10-26T03:52:07Z RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES CAI MIAO ELECTRICAL & COMPUTER ENGINEERING Yongxin Guo LEANG SERN EE Chunxiang Zhu Reliability; HV LDMOS; HCI; BTI; Degradation; SOA Master's MASTER OF ENGINEERING (CDE) 2023-04-30T18:00:38Z 2023-04-30T18:00:38Z 2023-01-09 Thesis CAI MIAO (2023-01-09). RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/239053 0009-0008-9688-3368 en |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| language |
English |
| topic |
Reliability; HV LDMOS; HCI; BTI; Degradation; SOA |
| spellingShingle |
Reliability; HV LDMOS; HCI; BTI; Degradation; SOA CAI MIAO RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
| description |
Master's |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING CAI MIAO |
| format |
Theses and Dissertations |
| author |
CAI MIAO |
| author_sort |
CAI MIAO |
| title |
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
| title_short |
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
| title_full |
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
| title_fullStr |
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
| title_full_unstemmed |
RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES |
| title_sort |
reliability characterization and modeling for high voltage ldmos devices |
| publishDate |
2023 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/239053 |
| _version_ |
1821199165805297664 |