Investigation on performance and reliability improvements of GaN-based heterostructure field effect transistors

Ph.D

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Bibliographic Details
Main Author:	TIAN FENG
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2011
Subjects:	AlGaN/GaN, heterostructure field effect transistors (HFETs), Schottky contact, metal-insulator-semiconductor (MIS), dielectric, gate leakage
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/25843
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-25843
record_format	dspace
spelling	sg-nus-scholar.10635-258432024-10-26T02:38:03Z Investigation on performance and reliability improvements of GaN-based heterostructure field effect transistors TIAN FENG ELECTRICAL & COMPUTER ENGINEERING CHOR ENG FONG AlGaN/GaN, heterostructure field effect transistors (HFETs), Schottky contact, metal-insulator-semiconductor (MIS), dielectric, gate leakage Ph.D DOCTOR OF PHILOSOPHY 2011-08-31T18:01:37Z 2011-08-31T18:01:37Z 2010-07-05 Thesis TIAN FENG (2010-07-05). Investigation on performance and reliability improvements of GaN-based heterostructure field effect transistors. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/25843 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	AlGaN/GaN, heterostructure field effect transistors (HFETs), Schottky contact, metal-insulator-semiconductor (MIS), dielectric, gate leakage
spellingShingle	AlGaN/GaN, heterostructure field effect transistors (HFETs), Schottky contact, metal-insulator-semiconductor (MIS), dielectric, gate leakage TIAN FENG Investigation on performance and reliability improvements of GaN-based heterostructure field effect transistors
description	Ph.D
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING TIAN FENG
format	Theses and Dissertations
author	TIAN FENG
author_sort	TIAN FENG
title	Investigation on performance and reliability improvements of GaN-based heterostructure field effect transistors
title_short	Investigation on performance and reliability improvements of GaN-based heterostructure field effect transistors
title_full	Investigation on performance and reliability improvements of GaN-based heterostructure field effect transistors
title_fullStr	Investigation on performance and reliability improvements of GaN-based heterostructure field effect transistors
title_full_unstemmed	Investigation on performance and reliability improvements of GaN-based heterostructure field effect transistors
title_sort	investigation on performance and reliability improvements of gan-based heterostructure field effect transistors
publishDate	2011
url	http://scholarbank.nus.edu.sg/handle/10635/25843
_version_	1821191891498041344

Investigation on performance and reliability improvements of GaN-based heterostructure field effect transistors

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