Performance, power, and reliability tradeoffs of STT-RAM cell subject to architecture-level requirement
10.1109/TMAG.2011.2159262
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sg-nus-scholar.10635-402642023-10-25T20:25:57Z Performance, power, and reliability tradeoffs of STT-RAM cell subject to architecture-level requirement Li, H. Wang, X. Ong, Z.-L. Wong, W.-F. Zhang, Y. Wang, P. Chen, Y. COMPUTER SCIENCE MRAM nonvolatility spin-torque spintronic 10.1109/TMAG.2011.2159262 IEEE Transactions on Magnetics 47 10 2356-2359 IEMGA 2013-07-04T08:00:20Z 2013-07-04T08:00:20Z 2011 Conference Paper Li, H., Wang, X., Ong, Z.-L., Wong, W.-F., Zhang, Y., Wang, P., Chen, Y. (2011). Performance, power, and reliability tradeoffs of STT-RAM cell subject to architecture-level requirement. IEEE Transactions on Magnetics 47 (10) : 2356-2359. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2011.2159262 00189464 http://scholarbank.nus.edu.sg/handle/10635/40264 000296418200004 Scopus |
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MRAM nonvolatility spin-torque spintronic Li, H. Wang, X. Ong, Z.-L. Wong, W.-F. Zhang, Y. Wang, P. Chen, Y. Performance, power, and reliability tradeoffs of STT-RAM cell subject to architecture-level requirement |
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10.1109/TMAG.2011.2159262 |
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COMPUTER SCIENCE |
author_facet |
COMPUTER SCIENCE Li, H. Wang, X. Ong, Z.-L. Wong, W.-F. Zhang, Y. Wang, P. Chen, Y. |
format |
Conference or Workshop Item |
author |
Li, H. Wang, X. Ong, Z.-L. Wong, W.-F. Zhang, Y. Wang, P. Chen, Y. |
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Li, H. |
title |
Performance, power, and reliability tradeoffs of STT-RAM cell subject to architecture-level requirement |
title_short |
Performance, power, and reliability tradeoffs of STT-RAM cell subject to architecture-level requirement |
title_full |
Performance, power, and reliability tradeoffs of STT-RAM cell subject to architecture-level requirement |
title_fullStr |
Performance, power, and reliability tradeoffs of STT-RAM cell subject to architecture-level requirement |
title_full_unstemmed |
Performance, power, and reliability tradeoffs of STT-RAM cell subject to architecture-level requirement |
title_sort |
performance, power, and reliability tradeoffs of stt-ram cell subject to architecture-level requirement |
publishDate |
2013 |
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http://scholarbank.nus.edu.sg/handle/10635/40264 |
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1781411084639404032 |