Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide
10.1109/16.918254
Saved in:
| Main Authors: | , , , , , |
|---|---|
| 其他作者: | |
| 格式: | Article |
| 出版: |
2014
|
| 在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/50559 |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
| id |
sg-nus-scholar.10635-50559 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-505592024-11-14T01:25:00Z Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide Guan, H. Cho, B.J. Li, M.F. Xu, Z. He, Y.D. Dong, Z. ELECTRICAL ENGINEERING ELECTRICAL & COMPUTER ENGINEERING 10.1109/16.918254 IEEE Transactions on Electron Devices 48 5 1010-1013 IETDA 2014-04-23T02:59:39Z 2014-04-23T02:59:39Z 2001-05 Article Guan, H., Cho, B.J., Li, M.F., Xu, Z., He, Y.D., Dong, Z. (2001-05). Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide. IEEE Transactions on Electron Devices 48 (5) : 1010-1013. ScholarBank@NUS Repository. https://doi.org/10.1109/16.918254 00189383 http://scholarbank.nus.edu.sg/handle/10635/50559 000168361000029 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1109/16.918254 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Guan, H. Cho, B.J. Li, M.F. Xu, Z. He, Y.D. Dong, Z. |
| format |
Article |
| author |
Guan, H. Cho, B.J. Li, M.F. Xu, Z. He, Y.D. Dong, Z. |
| spellingShingle |
Guan, H. Cho, B.J. Li, M.F. Xu, Z. He, Y.D. Dong, Z. Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide |
| author_sort |
Guan, H. |
| title |
Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide |
| title_short |
Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide |
| title_full |
Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide |
| title_fullStr |
Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide |
| title_full_unstemmed |
Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide |
| title_sort |
experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/50559 |
| _version_ |
1821233016256593920 |