Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide
10.1109/16.918254
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Main Authors: | Guan, H., Cho, B.J., Li, M.F., Xu, Z., He, Y.D., Dong, Z. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/50559 |
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Institution: | National University of Singapore |
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