Correlation between interface traps and gate oxide leakage current in the direct tunneling regime

10.1063/1.1492011

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Main Authors: Loh, W.Y., Cho, B.J., Li, M.F.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55453
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-554532023-10-25T23:11:41Z Correlation between interface traps and gate oxide leakage current in the direct tunneling regime Loh, W.Y. Cho, B.J. Li, M.F. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1492011 Applied Physics Letters 81 2 379-381 APPLA 2014-06-17T02:43:16Z 2014-06-17T02:43:16Z 2002-07-08 Article Loh, W.Y., Cho, B.J., Li, M.F. (2002-07-08). Correlation between interface traps and gate oxide leakage current in the direct tunneling regime. Applied Physics Letters 81 (2) : 379-381. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1492011 00036951 http://scholarbank.nus.edu.sg/handle/10635/55453 000176487400065 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.1492011
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Loh, W.Y.
Cho, B.J.
Li, M.F.
format Article
author Loh, W.Y.
Cho, B.J.
Li, M.F.
spellingShingle Loh, W.Y.
Cho, B.J.
Li, M.F.
Correlation between interface traps and gate oxide leakage current in the direct tunneling regime
author_sort Loh, W.Y.
title Correlation between interface traps and gate oxide leakage current in the direct tunneling regime
title_short Correlation between interface traps and gate oxide leakage current in the direct tunneling regime
title_full Correlation between interface traps and gate oxide leakage current in the direct tunneling regime
title_fullStr Correlation between interface traps and gate oxide leakage current in the direct tunneling regime
title_full_unstemmed Correlation between interface traps and gate oxide leakage current in the direct tunneling regime
title_sort correlation between interface traps and gate oxide leakage current in the direct tunneling regime
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/55453
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