Electric passivation of interface traps at drain junction space charge region in p-MOS transistors
10.1016/S0026-2714(01)00172-X
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sg-nus-scholar.10635-558122023-10-25T20:41:28Z Electric passivation of interface traps at drain junction space charge region in p-MOS transistors Chen, G. Li, M.F. Jin, Y. ELECTRICAL & COMPUTER ENGINEERING ELECTRICAL ENGINEERING 10.1016/S0026-2714(01)00172-X Microelectronics Reliability 41 9-10 1427-1431 MCRLA 2014-06-17T02:47:24Z 2014-06-17T02:47:24Z 2001-09 Article Chen, G., Li, M.F., Jin, Y. (2001-09). Electric passivation of interface traps at drain junction space charge region in p-MOS transistors. Microelectronics Reliability 41 (9-10) : 1427-1431. ScholarBank@NUS Repository. https://doi.org/10.1016/S0026-2714(01)00172-X 00262714 http://scholarbank.nus.edu.sg/handle/10635/55812 000171384900027 Scopus |
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10.1016/S0026-2714(01)00172-X |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Chen, G. Li, M.F. Jin, Y. |
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Chen, G. Li, M.F. Jin, Y. |
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Chen, G. Li, M.F. Jin, Y. Electric passivation of interface traps at drain junction space charge region in p-MOS transistors |
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Chen, G. |
title |
Electric passivation of interface traps at drain junction space charge region in p-MOS transistors |
title_short |
Electric passivation of interface traps at drain junction space charge region in p-MOS transistors |
title_full |
Electric passivation of interface traps at drain junction space charge region in p-MOS transistors |
title_fullStr |
Electric passivation of interface traps at drain junction space charge region in p-MOS transistors |
title_full_unstemmed |
Electric passivation of interface traps at drain junction space charge region in p-MOS transistors |
title_sort |
electric passivation of interface traps at drain junction space charge region in p-mos transistors |
publishDate |
2014 |
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http://scholarbank.nus.edu.sg/handle/10635/55812 |
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1781412193822048256 |