Electric passivation of interface traps at drain junction space charge region in p-MOS transistors

10.1016/S0026-2714(01)00172-X

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書目詳細資料
Main Authors: Chen, G., Li, M.F., Jin, Y.
其他作者: ELECTRICAL ENGINEERING
格式: Article
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/55812
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