Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement

Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement

10.1109/TED.2004.833590

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Bibliographic Details
Main Authors: Hong, Y.D., Yeow, Y.T., Chim, W.-K., Wong, K.-M., Kopanski, J.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56325
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Institution: National University of Singapore
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Summary:10.1109/TED.2004.833590

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