Investigation of active Si pitting and its impact on 0.15 and 0.30 μm n-type metal-oxide-semiconductor and p-type metal-oxide-semiconductor transistors

10.1116/1.1518972

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書目詳細資料
Main Authors: Chua, C.S., Chor, E.F., Goh, F., See, A., Chan, L.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Article
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/56396
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