On control of resist film uniformity in the microlithography process

10.1016/j.conengprac.2003.12.001

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Bibliographic Details
Main Authors: Ho, W.K., Tay, A., Lee, L.L., Schaper, C.D.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56858
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Institution: National University of Singapore
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