On control of resist film uniformity in the microlithography process
10.1016/j.conengprac.2003.12.001
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Main Authors: | Ho, W.K., Tay, A., Lee, L.L., Schaper, C.D. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56858 |
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Institution: | National University of Singapore |
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