Probing the ErSi1.7 Phase formation by micro-Raman spectroscopy
10.1149/1.2710201
Saved in:
Main Authors: | Lee, R.T.-P., Tan, K.-M., Liow, T.-Y., Ho, C.-S., Tripathy, S., Samudra, G.S., Chi, D.-Z., Yeo, Y.-C. |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/57125 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Effects of Si(001) surface amorphization on ErSi2 thin film
by: Tan, E.J., et al.
Published: (2014) -
Effects of Si(001) surface amorphization on ErSi2 thin film
by: Pey, Kin Leong, et al.
Published: (2013) -
Annealing-induced group v intermixing in InAs/InP quantum dots probed by micro-Raman spectroscopy
by: Tripathy, S., et al.
Published: (2014) -
Applications of micro-Raman spectroscopy in salicide characterization for Si device fabrication
by: Zhao, F.F., et al.
Published: (2014) -
Detection of Ge and Si intermixing in Ge/Si using multiwavelength micro-raman spectroscopy
by: Yoo, Woo Sik, et al.
Published: (2015)