Resist film uniformity in the microlithography process

10.1109/TSM.2002.801380

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Bibliographic Details
Main Authors: Ho, W.K., Lee, L.L., Tay, A., Schaper, C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/57255
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-572552023-10-30T21:49:49Z Resist film uniformity in the microlithography process Ho, W.K. Lee, L.L. Tay, A. Schaper, C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/TSM.2002.801380 IEEE Transactions on Semiconductor Manufacturing 15 3 323-330 ITSME 2014-06-17T03:04:05Z 2014-06-17T03:04:05Z 2002-08 Article Ho, W.K., Lee, L.L., Tay, A., Schaper, C. (2002-08). Resist film uniformity in the microlithography process. IEEE Transactions on Semiconductor Manufacturing 15 (3) : 323-330. ScholarBank@NUS Repository. https://doi.org/10.1109/TSM.2002.801380 08946507 http://scholarbank.nus.edu.sg/handle/10635/57255 000177372200003 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/TSM.2002.801380
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Ho, W.K.
Lee, L.L.
Tay, A.
Schaper, C.
format Article
author Ho, W.K.
Lee, L.L.
Tay, A.
Schaper, C.
spellingShingle Ho, W.K.
Lee, L.L.
Tay, A.
Schaper, C.
Resist film uniformity in the microlithography process
author_sort Ho, W.K.
title Resist film uniformity in the microlithography process
title_short Resist film uniformity in the microlithography process
title_full Resist film uniformity in the microlithography process
title_fullStr Resist film uniformity in the microlithography process
title_full_unstemmed Resist film uniformity in the microlithography process
title_sort resist film uniformity in the microlithography process
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/57255
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