Resist film uniformity in the microlithography process
10.1109/TSM.2002.801380
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sg-nus-scholar.10635-572552023-10-30T21:49:49Z Resist film uniformity in the microlithography process Ho, W.K. Lee, L.L. Tay, A. Schaper, C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/TSM.2002.801380 IEEE Transactions on Semiconductor Manufacturing 15 3 323-330 ITSME 2014-06-17T03:04:05Z 2014-06-17T03:04:05Z 2002-08 Article Ho, W.K., Lee, L.L., Tay, A., Schaper, C. (2002-08). Resist film uniformity in the microlithography process. IEEE Transactions on Semiconductor Manufacturing 15 (3) : 323-330. ScholarBank@NUS Repository. https://doi.org/10.1109/TSM.2002.801380 08946507 http://scholarbank.nus.edu.sg/handle/10635/57255 000177372200003 Scopus |
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10.1109/TSM.2002.801380 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Ho, W.K. Lee, L.L. Tay, A. Schaper, C. |
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Ho, W.K. Lee, L.L. Tay, A. Schaper, C. |
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Ho, W.K. Lee, L.L. Tay, A. Schaper, C. Resist film uniformity in the microlithography process |
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Ho, W.K. |
title |
Resist film uniformity in the microlithography process |
title_short |
Resist film uniformity in the microlithography process |
title_full |
Resist film uniformity in the microlithography process |
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Resist film uniformity in the microlithography process |
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Resist film uniformity in the microlithography process |
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resist film uniformity in the microlithography process |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/57255 |
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