Resist film uniformity in the microlithography process
10.1109/TSM.2002.801380
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Main Authors: | Ho, W.K., Lee, L.L., Tay, A., Schaper, C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/57255 |
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Institution: | National University of Singapore |
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