Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration

Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration

10.1109/16.381995

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Bibliographic Details
Main Authors: Chan, Daniel S.H., Ong, Vincent K.S., Phang, Jacob C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62049
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Institution: National University of Singapore
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Summary:10.1109/16.381995

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