Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration
10.1109/16.381995
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sg-nus-scholar.10635-620492023-10-30T07:52:06Z Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration Chan, Daniel S.H. Ong, Vincent K.S. Phang, Jacob C.H. ELECTRICAL ENGINEERING 10.1109/16.381995 IEEE Transactions on Electron Devices 42 5 963-968 IETDA 2014-06-17T06:46:53Z 2014-06-17T06:46:53Z 1995-05 Article Chan, Daniel S.H., Ong, Vincent K.S., Phang, Jacob C.H. (1995-05). Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration. IEEE Transactions on Electron Devices 42 (5) : 963-968. ScholarBank@NUS Repository. https://doi.org/10.1109/16.381995 00189383 http://scholarbank.nus.edu.sg/handle/10635/62049 A1995QU42700025 Scopus |
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10.1109/16.381995 |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Chan, Daniel S.H. Ong, Vincent K.S. Phang, Jacob C.H. |
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Chan, Daniel S.H. Ong, Vincent K.S. Phang, Jacob C.H. |
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Chan, Daniel S.H. Ong, Vincent K.S. Phang, Jacob C.H. Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration |
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Chan, Daniel S.H. |
title |
Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration |
title_short |
Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration |
title_full |
Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration |
title_fullStr |
Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration |
title_full_unstemmed |
Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration |
title_sort |
direct method for the extraction of diffusion length and surface recombination velocity from an ebic line scan: planar junction configuration |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/62049 |
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1781782131687555072 |