Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration

10.1109/16.381995

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Main Authors: Chan, Daniel S.H., Ong, Vincent K.S., Phang, Jacob C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62049
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-620492023-10-30T07:52:06Z Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration Chan, Daniel S.H. Ong, Vincent K.S. Phang, Jacob C.H. ELECTRICAL ENGINEERING 10.1109/16.381995 IEEE Transactions on Electron Devices 42 5 963-968 IETDA 2014-06-17T06:46:53Z 2014-06-17T06:46:53Z 1995-05 Article Chan, Daniel S.H., Ong, Vincent K.S., Phang, Jacob C.H. (1995-05). Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration. IEEE Transactions on Electron Devices 42 (5) : 963-968. ScholarBank@NUS Repository. https://doi.org/10.1109/16.381995 00189383 http://scholarbank.nus.edu.sg/handle/10635/62049 A1995QU42700025 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/16.381995
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Chan, Daniel S.H.
Ong, Vincent K.S.
Phang, Jacob C.H.
format Article
author Chan, Daniel S.H.
Ong, Vincent K.S.
Phang, Jacob C.H.
spellingShingle Chan, Daniel S.H.
Ong, Vincent K.S.
Phang, Jacob C.H.
Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration
author_sort Chan, Daniel S.H.
title Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration
title_short Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration
title_full Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration
title_fullStr Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration
title_full_unstemmed Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration
title_sort direct method for the extraction of diffusion length and surface recombination velocity from an ebic line scan: planar junction configuration
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/62049
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