Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration
10.1109/16.381995
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Main Authors: | Chan, Daniel S.H., Ong, Vincent K.S., Phang, Jacob C.H. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62049 |
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Institution: | National University of Singapore |
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