Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM)
Microelectronics Reliability
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sg-nus-scholar.10635-621812024-11-13T12:54:05Z Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM) Fiege, G.B.M. Feige, V. Phang, J.C.H. Maywald, M. Görlich, S. Balk, L.J. ELECTRICAL ENGINEERING Microelectronics Reliability 38 6-8 957-961 MCRLA 2014-06-17T06:48:16Z 2014-06-17T06:48:16Z 1998 Article Fiege, G.B.M.,Feige, V.,Phang, J.C.H.,Maywald, M.,Görlich, S.,Balk, L.J. (1998). Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM). Microelectronics Reliability 38 (6-8) : 957-961. ScholarBank@NUS Repository. 00262714 http://scholarbank.nus.edu.sg/handle/10635/62181 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
Microelectronics Reliability |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Fiege, G.B.M. Feige, V. Phang, J.C.H. Maywald, M. Görlich, S. Balk, L.J. |
| format |
Article |
| author |
Fiege, G.B.M. Feige, V. Phang, J.C.H. Maywald, M. Görlich, S. Balk, L.J. |
| spellingShingle |
Fiege, G.B.M. Feige, V. Phang, J.C.H. Maywald, M. Görlich, S. Balk, L.J. Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM) |
| author_sort |
Fiege, G.B.M. |
| title |
Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM) |
| title_short |
Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM) |
| title_full |
Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM) |
| title_fullStr |
Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM) |
| title_full_unstemmed |
Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM) |
| title_sort |
failure analysis of integrated devices by scanning thermal microscopy (sthm) |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/62181 |
| _version_ |
1821215779217997824 |