Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM)

Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM)

Microelectronics Reliability

Saved in:

書目詳細資料
Main Authors:	Fiege, G.B.M., Feige, V., Phang, J.C.H., Maywald, M., Görlich, S., Balk, L.J.
其他作者:	ELECTRICAL ENGINEERING
格式:	Article
出版:	2014
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/62181
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

相似書籍

Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)
由: Lee, T.H., et al.
出版: (2014)

Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM / ESEM-hybrid-system
由: Tiedemann, A.-K., et al.
出版: (2014)

Incorporation of dielectric layer onto SThM tips for direct thermal analysis
由: HU, CHANG CHAUN, et al.
出版: (2012)

Investigation of tunnel-regenerated multi-active-region light-emitting diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM)
由: Lee, T.H., et al.
出版: (2014)

Characterization of interconnect defects using scanning thermal conductivity microscopy
由: Ho, H.W., et al.
出版: (2014)

Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy
由: Tiedemann, A.-K., et al.
出版: (2014)

Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy
由: Hendarto, E., et al.
出版: (2014)

Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
由: Ho, H.W., et al.
出版: (2014)

Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device
由: Heiderhoff, R., et al.
出版: (2014)

Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations
由: Tiedemann, A.-K., et al.
出版: (2014)

Characterization of electronic materials and devices by scanning near-field microscopy
由: Balk, L.J., et al.
出版: (2014)

Scanning near-field photon emission microscopy
由: Isakov, D., et al.
出版: (2014)

Front- and backside investigations of thermal and electronic properties of semiconducting devices
由: Fiege, G.B.M., et al.
出版: (2014)

Front- and backside investigations of thermal and electronic properties of semiconducting devices
由: Fiege, G.B.M., et al.
出版: (2014)

Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS
由: Palaniappan, M., et al.
出版: (2014)

Enhanced pixel by pixel emissivity correction for thermal microscopy
由: Goh, S.H., et al.
出版: (2014)

Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation
由: Wong, W.K., et al.
出版: (2014)

Applications of scanning near-field photon emission microscopy
由: Isakov, D.V., et al.
出版: (2014)

Resolution and sensitivity enhancements of scanning optical microscopy techniques for integrated circuit failure analysis
由: Phang, J.C.H., et al.
出版: (2014)

Charging control using pulsed scanning electron microscopy
由: Wong, W.K., et al.
出版: (2014)

Determination of the local electric field strength by energy dispersive Photon Emission Microscopy
由: Geinzer, T., et al.
出版: (2014)

Applications of scanning Near-field photon emission microscopy
由: Isakov, D., et al.
出版: (2014)

Scanning Thermal Microscopy Methodology for Accurate and Reliable Thermal Measurement
由: HO HENG WAH
出版: (2013)

Characterization of electromigration defects using scanning thermal microscopy
由: ZHENG XINHUA
出版: (2010)

Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy
由: Meng, L., et al.
出版: (2014)

Dedicated near-field microscopies for electronic materials and devices
由: Balk, L.J., et al.
出版: (2014)

Scanning thermal microscopy and atomic force microscopy studies of laser-induced deposited metal lines
由: Zhou, L., et al.
出版: (2014)

Application of automated defect detection for failure analysis in scanning acoustic microscopy
由: Tang, Wai Kit
出版: (2024)

Thermal-induced chemical modification of palladium acetate on the submicrometer scale by in situ scanning thermal microscopy
由: Ng, H.T., et al.
出版: (2014)

Ion beam induced charge microscopy studies of power diodes
由: Zmeck, M., et al.
出版: (2014)

Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
由: Pey, K.L., et al.
出版: (2014)

Scanning electron microscopy of Blastocystis hominis cysts
由: Zaman, V., et al.
出版: (2016)

Analysis of premature breakdown in high-power devices using IBIC microscopy
由: Zmeck, M., et al.
出版: (2014)

Scanning electro-microscopy of alloys
由: Koh, Jin Ming
出版: (2020)

Scanning electron-microscopy of alloys
由: Cheng, Derrick Sheng Chun
出版: (2019)

Scanning electro-microscopy of alloys
由: Yong, Jovi Min
出版: (2019)

Analysis of E-field distributions within high-power devices using IBIC microscopy
由: Zmeck, M., et al.
出版: (2014)

A review of near infrared photon emission microscopy and spectroscopy
由: Phang, J.C.H., et al.
出版: (2014)

Soil-transmitted helminths (STH) contamination in De La Salle University grounds
由: Pimentel, Marc Carlos Aying, et al.
出版: (2024)

Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopy
由: Meng, L., et al.
出版: (2014)