Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing
IEEE Electron Device Letters
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Main Authors: | Chim, W.K., Yeo, B.P., Lim, P.S., Chan, D.S.H. |
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Other Authors: | ELECTRICAL ENGINEERING |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62394 |
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Institution: | National University of Singapore |
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