Recombination lifetime in silicon from laser microwave photoconductance decay measurement

Materials Science Forum

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Bibliographic Details
Main Authors: Ling, C.H., Teoh, H.K., Choi, W.K., Zhou, T.Q., Ah, L.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62685
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Institution: National University of Singapore
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Summary:Materials Science Forum