Recombination lifetime in silicon from laser microwave photoconductance decay measurement

Materials Science Forum

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Main Authors: Ling, C.H., Teoh, H.K., Choi, W.K., Zhou, T.Q., Ah, L.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62685
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-626852024-11-09T07:32:57Z Recombination lifetime in silicon from laser microwave photoconductance decay measurement Ling, C.H. Teoh, H.K. Choi, W.K. Zhou, T.Q. Ah, L.K. ELECTRICAL ENGINEERING Materials Science Forum 173-174 255-258 MSFOE 2014-06-17T06:53:45Z 2014-06-17T06:53:45Z 1995 Article Ling, C.H.,Teoh, H.K.,Choi, W.K.,Zhou, T.Q.,Ah, L.K. (1995). Recombination lifetime in silicon from laser microwave photoconductance decay measurement. Materials Science Forum 173-174 : 255-258. ScholarBank@NUS Repository. 02555476 http://scholarbank.nus.edu.sg/handle/10635/62685 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Materials Science Forum
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Ling, C.H.
Teoh, H.K.
Choi, W.K.
Zhou, T.Q.
Ah, L.K.
format Article
author Ling, C.H.
Teoh, H.K.
Choi, W.K.
Zhou, T.Q.
Ah, L.K.
spellingShingle Ling, C.H.
Teoh, H.K.
Choi, W.K.
Zhou, T.Q.
Ah, L.K.
Recombination lifetime in silicon from laser microwave photoconductance decay measurement
author_sort Ling, C.H.
title Recombination lifetime in silicon from laser microwave photoconductance decay measurement
title_short Recombination lifetime in silicon from laser microwave photoconductance decay measurement
title_full Recombination lifetime in silicon from laser microwave photoconductance decay measurement
title_fullStr Recombination lifetime in silicon from laser microwave photoconductance decay measurement
title_full_unstemmed Recombination lifetime in silicon from laser microwave photoconductance decay measurement
title_sort recombination lifetime in silicon from laser microwave photoconductance decay measurement
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/62685
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