Stress-induced leakage current and lateral nonuniform charge generation in thermal oxides subjected to negative-gate-voltage impulse stressing
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Saved in:
| Main Authors: | , |
|---|---|
| 其他作者: | |
| 格式: | Article |
| 出版: |
2014
|
| 主題: | |
| 在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/62817 |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|