Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy
10.1109/IPFA.2009.5232596
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2014
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sg-nus-scholar.10635-692392015-01-11T13:53:23Z Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy Tiedemann, A.-K. Fakhri, M. Heiderhoff, R. Phang, J.C.H. Balk, L.J. ELECTRICAL & COMPUTER ENGINEERING 10.1109/IPFA.2009.5232596 Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 515-519 2014-06-19T02:58:24Z 2014-06-19T02:58:24Z 2009 Conference Paper Tiedemann, A.-K.,Fakhri, M.,Heiderhoff, R.,Phang, J.C.H.,Balk, L.J. (2009). Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 515-519. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IPFA.2009.5232596" target="_blank">https://doi.org/10.1109/IPFA.2009.5232596</a> 9781424439102 http://scholarbank.nus.edu.sg/handle/10635/69239 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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ScholarBank@NUS |
| description |
10.1109/IPFA.2009.5232596 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Tiedemann, A.-K. Fakhri, M. Heiderhoff, R. Phang, J.C.H. Balk, L.J. |
| format |
Conference or Workshop Item |
| author |
Tiedemann, A.-K. Fakhri, M. Heiderhoff, R. Phang, J.C.H. Balk, L.J. |
| spellingShingle |
Tiedemann, A.-K. Fakhri, M. Heiderhoff, R. Phang, J.C.H. Balk, L.J. Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy |
| author_sort |
Tiedemann, A.-K. |
| title |
Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy |
| title_short |
Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy |
| title_full |
Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy |
| title_fullStr |
Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy |
| title_full_unstemmed |
Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy |
| title_sort |
advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion microscopy |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/69239 |
| _version_ |
1681086977291583488 |