Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy

10.1109/IPFA.2009.5232596

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Bibliographic Details
Main Authors: Tiedemann, A.-K., Fakhri, M., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69239
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Institution: National University of Singapore
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