Analysis of premature breakdown in high-power devices using IBIC microscopy

Analysis of premature breakdown in high-power devices using IBIC microscopy

2005 European Conference on Power Electronics and Applications

Saved in:
書目詳細資料
Main Authors: Zmeck, M., Balk, L.J., Pugatschow, A., Niedernostheide, F.-J., Schulze, H.-J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Conference or Workshop Item
出版: 2014
主題:
Device characterization
Measurement
Power semiconductor device
Reliability
Simulation
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/69400
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!
實物特徵
總結:2005 European Conference on Power Electronics and Applications

相似書籍