Integrated bake/chill module with in situ temperature measurement for photoresist processing
10.1109/TSM.2004.826959
Saved in:
Main Authors: | , , , , , |
---|---|
Other Authors: | |
Format: | Conference or Workshop Item |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/70617 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
id |
sg-nus-scholar.10635-70617 |
---|---|
record_format |
dspace |
spelling |
sg-nus-scholar.10635-706172023-10-26T08:59:14Z Integrated bake/chill module with in situ temperature measurement for photoresist processing Tay, A. Ho, W.-K. Loh, A.-P. Lim, K.-W. Tan, W.-W. Schaper, C.D. ELECTRICAL & COMPUTER ENGINEERING 300-mm wafer processing In situ temperature measurement Lithography Photoresist processing 10.1109/TSM.2004.826959 IEEE Transactions on Semiconductor Manufacturing 17 2 231-242 ITSME 2014-06-19T03:14:13Z 2014-06-19T03:14:13Z 2004-05 Conference Paper Tay, A., Ho, W.-K., Loh, A.-P., Lim, K.-W., Tan, W.-W., Schaper, C.D. (2004-05). Integrated bake/chill module with in situ temperature measurement for photoresist processing. IEEE Transactions on Semiconductor Manufacturing 17 (2) : 231-242. ScholarBank@NUS Repository. https://doi.org/10.1109/TSM.2004.826959 08946507 http://scholarbank.nus.edu.sg/handle/10635/70617 000221313700019 Scopus |
institution |
National University of Singapore |
building |
NUS Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NUS Library |
collection |
ScholarBank@NUS |
topic |
300-mm wafer processing In situ temperature measurement Lithography Photoresist processing |
spellingShingle |
300-mm wafer processing In situ temperature measurement Lithography Photoresist processing Tay, A. Ho, W.-K. Loh, A.-P. Lim, K.-W. Tan, W.-W. Schaper, C.D. Integrated bake/chill module with in situ temperature measurement for photoresist processing |
description |
10.1109/TSM.2004.826959 |
author2 |
ELECTRICAL & COMPUTER ENGINEERING |
author_facet |
ELECTRICAL & COMPUTER ENGINEERING Tay, A. Ho, W.-K. Loh, A.-P. Lim, K.-W. Tan, W.-W. Schaper, C.D. |
format |
Conference or Workshop Item |
author |
Tay, A. Ho, W.-K. Loh, A.-P. Lim, K.-W. Tan, W.-W. Schaper, C.D. |
author_sort |
Tay, A. |
title |
Integrated bake/chill module with in situ temperature measurement for photoresist processing |
title_short |
Integrated bake/chill module with in situ temperature measurement for photoresist processing |
title_full |
Integrated bake/chill module with in situ temperature measurement for photoresist processing |
title_fullStr |
Integrated bake/chill module with in situ temperature measurement for photoresist processing |
title_full_unstemmed |
Integrated bake/chill module with in situ temperature measurement for photoresist processing |
title_sort |
integrated bake/chill module with in situ temperature measurement for photoresist processing |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/70617 |
_version_ |
1781783171244752896 |