Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs

10.1109/IPFA.2008.4588178

Saved in:

Bibliographic Details
Main Authors:	Tan, S.L., Teo, J.K.J., Toh, K.H., Isakov, D., Chan, D.S.H., Koh, L.S., Chua, C.M., Phang, J.C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/71104
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

Description
Summary:	10.1109/IPFA.2008.4588178

Similar Items