Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
10.1109/IPFA.2008.4588178
Saved in:
Main Authors: | Tan, S.L., Teo, J.K.J., Toh, K.H., Isakov, D., Chan, D.S.H., Koh, L.S., Chua, C.M., Phang, J.C.H. |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/71104 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
by: Tan, S.L., et al.
Published: (2014) -
Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy
by: Hendarto, E., et al.
Published: (2014) -
Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETs
by: Tan, S.L., et al.
Published: (2014) -
Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS
by: Palaniappan, M., et al.
Published: (2014) -
Effects of microtrenching from polysilicon gate patterning on 0.13μm MOSFET device performance
by: Chua, C.S., et al.
Published: (2014)