Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs

Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs

10.1109/IPFA.2008.4588178

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Main Authors: Tan, S.L., Teo, J.K.J., Toh, K.H., Isakov, D., Chan, D.S.H., Koh, L.S., Chua, C.M., Phang, J.C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71104
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-711042015-02-23T09:02:38Z Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs Tan, S.L. Teo, J.K.J. Toh, K.H. Isakov, D. Chan, D.S.H. Koh, L.S. Chua, C.M. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING 10.1109/IPFA.2008.4588178 Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA - 2014-06-19T03:19:53Z 2014-06-19T03:19:53Z 2008 Conference Paper Tan, S.L.,Teo, J.K.J.,Toh, K.H.,Isakov, D.,Chan, D.S.H.,Koh, L.S.,Chua, C.M.,Phang, J.C.H. (2008). Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : -. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IPFA.2008.4588178" target="_blank">https://doi.org/10.1109/IPFA.2008.4588178</a> 1424420393 http://scholarbank.nus.edu.sg/handle/10635/71104 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description 10.1109/IPFA.2008.4588178
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Tan, S.L.
Teo, J.K.J.
Toh, K.H.
Isakov, D.
Chan, D.S.H.
Koh, L.S.
Chua, C.M.
Phang, J.C.H.
format Conference or Workshop Item
author Tan, S.L.
Teo, J.K.J.
Toh, K.H.
Isakov, D.
Chan, D.S.H.
Koh, L.S.
Chua, C.M.
Phang, J.C.H.
spellingShingle Tan, S.L.
Teo, J.K.J.
Toh, K.H.
Isakov, D.
Chan, D.S.H.
Koh, L.S.
Chua, C.M.
Phang, J.C.H.
Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
author_sort Tan, S.L.
title Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
title_short Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
title_full Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
title_fullStr Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
title_full_unstemmed Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs
title_sort near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nmosfets and pmosfets
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/71104
_version_ 1681087322706149376

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